XRD, short for X-ray diffraction, is a technique used to study the crystal structure and properties of materials at the atomic level. It is an analytical method that involves directing a beam of X-rays at a sample and analyzing the pattern of scattered X-rays that result from the interaction of the X-rays with the material's atomic arrangement.
XRD relies on the principle of constructive interference, where the scattered X-rays interfere with each other, forming a distinct pattern of peaks and valleys. These peaks correspond to the diffracted X-rays that have undergone a change in direction due to interaction with the crystal lattice planes of the sample. By analyzing the angles and intensities of these peaks, valuable information about the crystal structure, crystallographic orientation, and composition of the material can be obtained.
XRD is widely used in the fields of materials science, geology, mineralogy, physics, chemistry, and solid-state engineering. It is employed to identify and characterize crystalline materials like minerals, metals, ceramics, polymers, and pharmaceuticals. XRD can determine parameters such as lattice spacing, unit cell dimensions, crystallite size, phase composition, and the presence of defects or impurities in a material. Additionally, it can be utilized to investigate phase transitions, texture analysis, stress/strain analysis, and amorphous or liquid structures.
Overall, XRD is a powerful and non-destructive technique for studying the arrangement and nature of atoms in crystalline materials, providing valuable insights into their crystallographic and physical properties.
