A single event upset (SEU) refers to the occurrence of an undesired change in the state of a digital device caused by a single ionizing particle striking sensitive regions within the device. These particles can originate from various sources, such as cosmic rays, atmospheric neutrons, or radioactive materials. SEUs are commonly encountered in the field of electronics, particularly in integrated circuits (ICs) or memory devices, where they can disrupt the normal operation and functionality of the system.
When an ionizing particle interacts with a digital device, it generates excessive charge carriers that can interfere with the integrity of stored data or alter the logic state of individual bits. This unexpected disruption caused by the particle impact results in a temporary or permanent error within the device. SEUs can manifest in diverse ways, ranging from single-bit flips or temporary upsets known as soft errors, to more severe consequences like latch-up, burnout, or destructive permanent faults.
To mitigate the impact of SEUs, designers employ various strategies such as error detection and correction codes, redundancy techniques, or shielding. Additionally, advancements in manufacturing processes and circuit design have led to the development of radiation-hardened or rad-hard devices, specifically engineered to endure the harsh conditions of space or other radiation-rich environments.
As technology continues to advance, the susceptibility to SEUs increases in certain applications, emphasizing the importance of understanding and addressing this phenomenon in order to ensure the reliability and resilience of electronic systems.
