SEU stands for "Single Event Upset." It is a phenomenon that occurs in electronic systems, particularly in semiconductors and computer memory chips, where a random perturbation or disturbance in the system can cause a temporary change in the state of a stored bit or the behavior of a logic gate.
An SEU can be triggered by various external factors such as radiation, atmospheric conditions, electromagnetic interference, or cosmic rays. These random disturbances can disrupt the normal operation of the system without causing permanent damage. SEUs often manifest as bit flips, where a 0 is changed to 1 or vice versa due to the electrical disturbance.
The probability of experiencing SEUs is dependent on system design, technology, and the radiation levels to which the system is exposed. To mitigate the effects of SEUs, various techniques are employed, including error detection and correction codes, redundancy, shielding, and design methodologies that account for possible sources of perturbations.
SEUs can have detrimental consequences on the reliability and integrity of electronic systems, especially in safety-critical applications such as aerospace, nuclear power plants, and medical devices. Therefore, it is of utmost importance to effectively protect and mitigate the occurrence of SEUs to ensure the correct operation of these critical systems.
