PIXE stands for Particle Induced X-ray Emission. It is an analytical technique used in materials science and archaeology to determine the elemental composition of a sample. By bombarding a sample with a beam of charged particles, such as protons, alpha particles, or ions, PIXE can identify and quantify the elements present in the sample.
In PIXE, the incident particles collide with the atoms in the sample, causing the emission of characteristic X-rays. These X-rays carry information about the atomic structure of the sample, allowing scientists to identify the elements based on their unique X-ray signatures. The emitted X-rays are then detected, and their energy and intensity are measured.
One of the main advantages of PIXE is its high sensitivity, enabling the detection and quantification of trace elements in a sample. It is a non-destructive technique, as the incident particles do not cause any significant damage to the sample. Moreover, PIXE can analyze samples of various sizes, ranging from micrometers to centimeters, making it versatile for different applications.
PIXE has found applications in numerous fields, including environmental monitoring, art conservation, forensic analysis, and archaeology. It has been particularly useful in the study of cultural heritage objects, allowing scientists to identify the materials used in ancient artworks and artifacts. Overall, PIXE provides valuable information about the elemental composition of materials, aiding scientists in understanding their properties and origins.
