How Do You Spell ELECTROMIGRATION?

Pronunciation: [ɪlˌɛktɹə͡ʊmɪɡɹˈe͡ɪʃən] (IPA)

Electromigration (/ɪˌlɛktroʊmaɪˈɡreɪʃən/) is the movement of atoms in a conductor due to the flow of an electric current. Although it may seem like a long and difficult word to spell, it is relatively easy when broken down into its components: "electro" (related to electricity) and "migration" (movement from one place to another). The pronunciation is straightforward, with the primary stress on the second syllable "mi" and the secondary stress on the third syllable "gra". Overall, electromigration is an important concept in understanding the behavior of electronics and electrical devices.

ELECTROMIGRATION Meaning and Definition

1. Electromigration refers to the process of material displacement or diffusion that occurs in electronic devices when subjected to a high electric current density. This phenomenon is particularly prominent in metals or metal conductors used in integrated circuits or microelectronic devices.

   During normal operation, electrons are forced through metallic conductors due to the presence of an electric field. However, at high current densities, the atomic migration of metal atoms or ions in the conductive channel becomes significant. Electromigration predominantly takes place at high stress points, such as joints, corners, or narrow wire segments, where electron flow is concentrated. As a result, electrical current-induced stress causes metal atoms to diffuse or migrate along the conductor, leading to the degradation and deformation of the material.

   Electromigration can result in numerous detrimental effects on electronic devices including increased resistance, device failure, signal distortion, and ultimately, catastrophic device breakdown. The material displacement disrupts the integrity of the conductor, leading to void formation, metal thinning, or even the complete loss of conductivity, which can cause device malfunction or failure.

   Designers and engineers implement various measures to mitigate the effects of electromigration, such as using high-quality conductive materials, optimizing design layouts to minimize current density hotspots, and employing advanced fabrication techniques that involve the addition of metal spacers or liner materials.

Common Misspellings for ELECTROMIGRATION

• wlectromigration
• slectromigration
• dlectromigration
• rlectromigration
• 4lectromigration
• 3lectromigration
• ekectromigration
• epectromigration
• eoectromigration
• elwctromigration
• elsctromigration
• eldctromigration
• elrctromigration
• el4ctromigration
• el3ctromigration
• elextromigration
• elevtromigration
• eleftromigration
• eledtromigration
• elecrromigration

Etymology of ELECTROMIGRATION

The word "electromigration" is composed of two parts: "electro" and "migration".

1. "Electro" is derived from the Greek word "ēlektron", meaning "amber". The ancient Greeks discovered that when amber was rubbed with fur, it could attract small objects. This phenomenon of attracting objects using static electricity was referred to as "ēlektron".

2. "Migration" comes from the Latin word "migratio", which means "movement" or "to migrate". The term implies the action of moving from one place to another.

Combining these two components, "electromigration" refers to the movement or migration of charged particles (usually atoms or molecules) within an electrically conductive material due to the influence of an electric field. This term is commonly used in the field of electronics and semiconductor physics to describe the phenomenon of atomic migration and material degradation in microelectronic devices.

Plural form of ELECTROMIGRATION is ELECTROMIGRATIONS