Convergent beam electron diffraction (CBED) is a specialized technique in electron crystallography and materials science that involves the use of a highly focused electron beam to investigate the crystal structure of a material. In CBED, a finely converging electron beam is directed onto a thin specimen, typically a crystalline sample, and the resulting diffraction pattern is analyzed.
The primary goal of CBED is to obtain information about the crystal structure and lattice parameters of the material under investigation. By employing a high degree of convergence, the diffracted electron beam forms a complex interference pattern, which contains valuable information about the atomic arrangement and symmetries of the crystal lattice.
CBED is commonly used to determine crystal structures, measure lattice constants, and investigate the presence of crystal defects such as stacking faults, dislocations, and grain boundaries. It provides a high-resolution imaging of the crystal lattice and can be performed under various imaging conditions, including dark-field, bright-field, and high-resolution imaging modes.
This technique offers several advantages over traditional electron diffraction methods, such as improved resolution and a higher signal-to-noise ratio. It also allows for the examination of small volumes within the crystal, making it particularly useful for the characterization of nanostructures and thin films.
Convergent beam electron diffraction is a powerful tool for the study of crystallography and materials science, offering valuable insights into the atomic arrangement and properties of materials at the nanoscale.
