Atomic Force Microscopy (AFM) is a high-resolution imaging technique used in nanotechnology and materials science to observe the surface topography and physical properties of materials at the atomic scale. It is a type of scanning probe microscopy that utilizes a sharp mechanical probe, typically a cantilever with a sharp tip at the end, which is scanned in a raster pattern over the sample surface.
The principle of AFM relies on measuring forces between the probe tip and the sample surface. As the probe interacts with the material, it experiences forces arising from atomic interactions, such as van der Waals forces, electrostatic forces, and chemical bonding forces. These forces cause the cantilever to deflect, and this deflection is detected and measured by laser light reflected off the cantilever, generating a topographic image of the sample surface.
Moreover, AFM offers various modes of operation to investigate different sample properties beyond topography, including magnetic, electrical, and mechanical properties. It can also be used in liquid environments, allowing the observation of biological samples in their natural environment.
The atomic resolution achieved by AFM has revolutionized the field of nanoscience and has been crucial in advancing our understanding of surface morphology, nanostructures, and material properties. It has extensive applications in diverse fields, including materials science, biology, physics, and chemistry, and continues to contribute to the development of new materials, nanodevices, and technological advancements.
