AFMM is an acronym that stands for "Atomic Force Microscopy Mode." It refers to a specific operational mode utilized in Atomic Force Microscopy (AFM). Atomic Force Microscopy is an advanced imaging technique used in scientific research to observe and study the surface of materials on an atomic scale. It provides valuable information about various physical and chemical properties of the sample being investigated.
AFMM, as a specific mode within AFM, offers additional functionalities and capabilities for analyzing the material's surface beyond basic imaging. It allows researchers to acquire precise measurements of mechanical properties such as elasticity, adhesion, and stiffness of the sample. By employing AFMM, scientists can gain insights into the surface topography and morphological characteristics of the material at an atomic level.
In AFMM, a sharp probe is scanned across the surface of the sample, creating a three-dimensional map by measuring the repulsive or attractive forces between the probe and the surface. This mode offers enhanced spatial resolution, enabling researchers to obtain highly detailed information about the sample, including its roughness, modulations, and nanostructures.
AFMM is widely employed in various scientific disciplines such as physics, chemistry, biology, and materials science. It has proven to be an invaluable tool for investigating surface phenomena, nanoscale structures, and properties, thus contributing to the advancement of scientific knowledge and technological developments in numerous fields.
