Pronunciation: [ˈafəm] (IPA) 
The spelling of "AFM" can be explained using the International Phonetic Alphabet (IPA). "AFM" is pronounced as /eɪɛfɛm/. The first sound, /eɪ/, represents the long "A" sound, as in "mate." The second and third sounds, /ɛf/, represent the sounds "E" and "F," respectively. The last sound, /ɛm/, represents the letter "M." Altogether, the spelling of "AFM" follows the standard English alphabet and can be easily pronounced using the IPA.
AFM, or Atomic Force Microscopy, refers to a high-resolution imaging technique used in nanoscale scientific research and engineering applications. It is based on the principles of atomic force, involving the interaction between a sharp probe tip and the surface of a sample being studied.
In AFM, a tiny cantilever is attached to a sharp tip. The tip is then positioned close to the surface of the sample, with the cantilever deflecting slightly due to forces such as Van der Waals, magnetic, or electrostatic forces. As the tip scans over the surface, the deflection of the cantilever is precisely measured, providing information about the surface topography down to the atomic scale.
The key advantage of AFM lies in its ability to obtain three-dimensional information about a specimen with superior resolution. This technique enables scientists to visualize individual atoms, surface roughness, and molecular structures, thereby aiding in various fields such as material science, semiconductor characterization, biology, and nanotechnology.
Moreover, AFM can provide insights into other sample properties, such as magnetic or electrical characteristics, by using specialized techniques. It can also be used for manipulating and manipulating nanoscale objects or measuring properties, such as mechanical forces or surface interactions.
In summary, AFM is a powerful microscopy technique that allows researchers to image and analyze materials at the nanoscale, providing valuable insights into the properties and behavior of samples at the atomic level.
